Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 / edited by K. Sumino.
By: International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
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Contributor(s): Sumino, K. (Kojī).
Material type: 
BookPublisher: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990Description: 2 v. : ill. ; 27 cm.ISBN: 0444884297(v. 1).Subject(s): Semiconductors -- Defects -- Congresses | Materials -- Defects -- CongressesDDC classification:
| Item type | Current location | Call number | Status | Notes | Date due | Item holds |
|---|---|---|---|---|---|---|
General Circulation Books
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General Stacks | QC611.6.D4 1989 (Browse shelf) | Available | CN-OLD LIB |
Total holds: 0
Includes bibliographical references and indexes.
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