Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 /
edited by K. Sumino.
- Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
- 2 v. : ill. ; 27 cm.
Includes bibliographical references and indexes.
0444884297(v. 1)
90042223
Semiconductors--Defects--Congresses.
Materials--Defects--Congresses.
QC611.6 / .D4 1989
Includes bibliographical references and indexes.
0444884297(v. 1)
90042223
Semiconductors--Defects--Congresses.
Materials--Defects--Congresses.
QC611.6 / .D4 1989