Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 / edited by K. Sumino.
By: International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
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Contributor(s): Sumino, K. (Kojī).
Material type: 
BookPublisher: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990Description: 2 v. : ill. ; 27 cm.ISBN: 0444884297(v. 1).Subject(s): Semiconductors -- Defects -- Congresses | Materials -- Defects -- CongressesDDC classification:
| Item type | Current location | Call number | Status | Notes | Date due | Item holds |
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General Circulation Books
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General Stacks | QC611.6.D4 1989 (Browse shelf) | Available | CN-OLD LIB |
Total holds: 0
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| QC601.R9 1955 "networks, lines and fields: | QC607.R44 1961 Foundation for electric network theory. | QC611.T78 1986 Physical electronics / | QC611.6.D4 1989 Defect control in semiconductors : | QC611.8.M66 1979 Technician structure and properties of metals 2: | QC611.98.H54 1989 Proceedings of the International Symposium on High Temperature Superconductivity, 6-8 July 1988, Department of Physics, University of Rajasthan, Jaipur, India / | QC612.T39 1970 Superconductivity |
Includes bibliographical references and indexes.
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