Library Services | Technical University of Kenya catalog › Results of search for 'au:"Virazel, Arnaud."'

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	1.	Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. by Bosio, Alberto \| Dilillo, Luigi \| Girard, Patrick \| Pravossoudovitch, Serge \| Virazel, Arnaud \| SpringerLink (Online service). Edition: 1.Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. by Bosio, Alberto [author.] \| Dilillo, Luigi [author.] \| Girard, Patrick [author.] \| Pravossoudovitch, Serge [author.] \| Virazel, Arnaud [author.] \| SpringerLink (Online service). Edition: 1.Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010Online access: Click here to access online Availability: No items available Add to cart (remove)

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