Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel.
By: Bosio, Alberto.
Contributor(s): Dilillo, Luigi | Girard, Patrick | Pravossoudovitch, Serge | Virazel, Arnaud | SpringerLink (Online service).
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