Bosio, Alberto.
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / [electronic resource] : by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. - 1. - Boston, MA : Springer US, 2010. - digital.
9781441909381
10.1007/978-1-4419-0938-1 doi
Engineering.
Computer aided design.
Systems engineering.
Engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
TK7888.4
621.3815
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / [electronic resource] : by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. - 1. - Boston, MA : Springer US, 2010. - digital.
9781441909381
10.1007/978-1-4419-0938-1 doi
Engineering.
Computer aided design.
Systems engineering.
Engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
TK7888.4
621.3815