Library Services | Technical University of Kenya catalog › Results of search for 'au:"Girard, Patrick."'

Your search returned 7 results.

	1.	Power-Aware Testing and Test Strategies for Low Power Devices [electronic resource] / edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. by Girard, Patrick \| Nicolici, Nicola \| Wen, Xiaoqing \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. by Bosio, Alberto \| Dilillo, Luigi \| Girard, Patrick \| Pravossoudovitch, Serge \| Virazel, Arnaud \| SpringerLink (Online service). Edition: 1.Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010Online access: Click here to access online Availability: No items available Add to cart (remove)
	3.	Quaternions, Clifford Algebras and Relativistic Physics [electronic resource] / by Patrick R. Girard. by Girard, Patrick R \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Basel : Birkhäuser Basel, 2007Online access: Click here to access online Availability: No items available Add to cart (remove)
	4.	Dynamic Formal Epistemology [electronic resource] / edited by Patrick Girard, Olivier Roy, Mathieu Marion. by Girard, Patrick \| Roy, Olivier \| Marion, Mathieu \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)
	5.	Dynamic Formal Epistemology [electronic resource] / edited by Patrick Girard, Olivier Roy, Mathieu Marion. by Girard, Patrick [editor.] \| Roy, Olivier [editor.] \| Marion, Mathieu [editor.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)
	6.	Power-Aware Testing and Test Strategies for Low Power Devices [electronic resource] / edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. by Girard, Patrick [editor.] \| Nicolici, Nicola [editor.] \| Wen, Xiaoqing [editor.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010Online access: Click here to access online Availability: No items available Add to cart (remove)
	7.	Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. by Bosio, Alberto [author.] \| Dilillo, Luigi [author.] \| Girard, Patrick [author.] \| Pravossoudovitch, Serge [author.] \| Virazel, Arnaud [author.] \| SpringerLink (Online service). Edition: 1.Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010Online access: Click here to access online Availability: No items available Add to cart (remove)

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue