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1. Reliability of Microtechnology [electronic resource] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.

by Liu, Johan | Salmela, Olli | Sarkka, Jussi | Morris, James E | Tegehall, Per-Erik | Andersson, Cristina | SpringerLink (Online service).

Edition: 1.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York, 2011Online access: Click here to access online Availability: No items available
2. Reliability of Microtechnology [electronic resource] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.

by Liu, Johan [author.] | Salmela, Olli [author.] | Sarkka, Jussi [author.] | Morris, James E [author.] | Tegehall, Per-Erik [author.] | Andersson, Cristina [author.] | SpringerLink (Online service).

Edition: 1.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York, 2011Online access: Click here to access online Availability: No items available

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