Reliability of Microtechnology [electronic resource] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.
By: Liu, Johan.
Contributor(s): Salmela, Olli | Sarkka, Jussi | Morris, James E | Tegehall, Per-Erik | Andersson, Cristina | SpringerLink (Online service).
Material type:
BookPublisher: New York, NY : Springer New York, 2011Edition: 1.Description: digital.ISBN: 9781441957603.Subject(s): Engineering | System safety | Electronics | Optical materials | Engineering | Electronics and Microelectronics, Instrumentation | Optical and Electronic Materials | Quality Control, Reliability, Safety and Risk | Nanotechnology and MicroengineeringDDC classification: 621.381 Online resources: Click here to access online
In:
Springer eBooks
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