Liu, Johan.
Reliability of Microtechnology Interconnects, Devices and Systems / [electronic resource] : by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson. - 1. - New York, NY : Springer New York, 2011. - digital.
9781441957603
10.1007/978-1-4419-5760-3 doi
Engineering.
System safety.
Electronics.
Optical materials.
Engineering.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Quality Control, Reliability, Safety and Risk.
Nanotechnology and Microengineering.
TK7800-8360 TK7874-7874.9
621.381
Reliability of Microtechnology Interconnects, Devices and Systems / [electronic resource] : by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson. - 1. - New York, NY : Springer New York, 2011. - digital.
9781441957603
10.1007/978-1-4419-5760-3 doi
Engineering.
System safety.
Electronics.
Optical materials.
Engineering.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Quality Control, Reliability, Safety and Risk.
Nanotechnology and Microengineering.
TK7800-8360 TK7874-7874.9
621.381