Lock-in Thermography [electronic resource] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
By: Breitenstein, Otwin.
Contributor(s): Warta, Wilhelm | Langenkamp, Martin | SpringerLink (Online service).
Material type:
BookSeries: Springer Series in Advanced Microelectronics, 10.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Description: digital.ISBN: 9783642024177.Subject(s): Physics | Engineering | Materials | Surfaces (Physics) | Physics | Optics, Optoelectronics, Plasmonics and Optical Devices | Characterization and Evaluation of Materials | Engineering, general | Structural MaterialsDDC classification: 621.36 Online resources: Click here to access online
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