Breitenstein, Otwin.
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / [electronic resource] : by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2010. - digital. - Springer Series in Advanced Microelectronics, 10 1437-0387 ; . - Springer Series in Advanced Microelectronics, 10 .
9783642024177
10.1007/978-3-642-02417-7 doi
Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
QC350-467 TA1501-1820 QC392-449.5
621.36
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / [electronic resource] : by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2010. - digital. - Springer Series in Advanced Microelectronics, 10 1437-0387 ; . - Springer Series in Advanced Microelectronics, 10 .
9783642024177
10.1007/978-3-642-02417-7 doi
Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
QC350-467 TA1501-1820 QC392-449.5
621.36