Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [electronic resource] : Application to Rough and Natural Surfaces / by Gerd Kaupp.
By: Kaupp, Gerd.
Contributor(s): SpringerLink (Online service).
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
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