Kaupp, Gerd.
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces / [electronic resource] : by Gerd Kaupp. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2006. - digital.
9783540284727
10.1007/978-3-540-28472-7 doi
Chemistry.
Chemistry, Physical organic.
Biochemistry.
Life sciences.
Physical optics.
Nanotechnology.
Chemistry.
Nanotechnology.
Applied Optics, Optoelectronics, Optical Devices.
Physics and Applied Physics in Engineering.
Physical Chemistry.
Medical Biochemistry.
Life Sciences, general.
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces / [electronic resource] : by Gerd Kaupp. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2006. - digital.
9783540284727
10.1007/978-3-540-28472-7 doi
Chemistry.
Chemistry, Physical organic.
Biochemistry.
Life sciences.
Physical optics.
Nanotechnology.
Chemistry.
Nanotechnology.
Applied Optics, Optoelectronics, Optical Devices.
Physics and Applied Physics in Engineering.
Physical Chemistry.
Medical Biochemistry.
Life Sciences, general.