Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.
By: Tehranipoor, Mohammad.
Contributor(s): SpringerLink (Online service).
Material type:
BookSeries: Frontiers in Electronic Testing, 37.Publisher: Boston, MA : Springer US, 2008Description: digital.ISBN: 9780387747477.Subject(s): Engineering | System safety | Computer engineering | Electronics | Systems engineering | Nanotechnology | Engineering | Circuits and Systems | Electronics and Microelectronics, Instrumentation | Nanotechnology | Quality Control, Reliability, Safety and Risk | Electrical EngineeringDDC classification: 621.3815 Online resources: Click here to access online
In:
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