Tehranipoor, Mohammad.
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability / [electronic resource] : edited by Mohammad Tehranipoor. - Boston, MA : Springer US, 2008. - digital. - Frontiers in Electronic Testing, 37 0929-1296 ; . - Frontiers in Electronic Testing, 37 .
9780387747477
10.1007/978-0-387-74747-7 doi
Engineering.
System safety.
Computer engineering.
Electronics.
Systems engineering.
Nanotechnology.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology.
Quality Control, Reliability, Safety and Risk.
Electrical Engineering.
TK7888.4
621.3815
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability / [electronic resource] : edited by Mohammad Tehranipoor. - Boston, MA : Springer US, 2008. - digital. - Frontiers in Electronic Testing, 37 0929-1296 ; . - Frontiers in Electronic Testing, 37 .
9780387747477
10.1007/978-0-387-74747-7 doi
Engineering.
System safety.
Computer engineering.
Electronics.
Systems engineering.
Nanotechnology.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology.
Quality Control, Reliability, Safety and Risk.
Electrical Engineering.
TK7888.4
621.3815