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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.

By: Sachdev, Manoj.
Contributor(s): Gyvez, José Pineda de | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Frontiers in Electronic Testing, 34.Publisher: Boston, MA : Springer US, 2007Description: digital.ISBN: 9780387465470.Subject(s): Engineering | Engineering design | Electronics | Systems engineering | Engineering | Circuits and Systems | Electronic and Computer Engineering | Engineering Design | Electronics and Microelectronics, InstrumentationDDC classification: 621.3815 Online resources: Click here to access online In: Springer eBooks
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