Sachdev, Manoj.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition / [electronic resource] : edited by Manoj Sachdev, José Pineda de Gyvez. - Boston, MA : Springer US, 2007. - digital. - Frontiers in Electronic Testing, 34 0929-1296 ; . - Frontiers in Electronic Testing, 34 .
9780387465470
10.1007/0-387-46547-2 doi
Engineering.
Engineering design.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronic and Computer Engineering.
Engineering Design.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition / [electronic resource] : edited by Manoj Sachdev, José Pineda de Gyvez. - Boston, MA : Springer US, 2007. - digital. - Frontiers in Electronic Testing, 34 0929-1296 ; . - Frontiers in Electronic Testing, 34 .
9780387465470
10.1007/0-387-46547-2 doi
Engineering.
Engineering design.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronic and Computer Engineering.
Engineering Design.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815