Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer.
By: Alford, Terry L.
Contributor(s): Feldman, Leonard C | Mayer, James W | SpringerLink (Online service).
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BookPublisher: Boston, MA : Springer US, 2007Description: digital.ISBN: 9780387292618.Subject(s): Chemistry | Condensed matter | Particles (Nuclear physics) | Electronics | Nanotechnology | Surfaces (Physics) | Chemistry | Characterization and Evaluation of Materials | Surfaces and Interfaces, Thin Films | Nanotechnology | Solid State Physics and Spectroscopy | Condensed Matter | Electronics and Microelectronics, InstrumentationOnline resources: Click here to access online
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