Alford, Terry L.
Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer. - Boston, MA : Springer US, 2007. - digital.
9780387292618
10.1007/978-0-387-29261-8 doi
Chemistry.
Condensed matter.
Particles (Nuclear physics).
Electronics.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Nanotechnology.
Solid State Physics and Spectroscopy.
Condensed Matter.
Electronics and Microelectronics, Instrumentation.
Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer. - Boston, MA : Springer US, 2007. - digital.
9780387292618
10.1007/978-0-387-29261-8 doi
Chemistry.
Condensed matter.
Particles (Nuclear physics).
Electronics.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Nanotechnology.
Solid State Physics and Spectroscopy.
Condensed Matter.
Electronics and Microelectronics, Instrumentation.