Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
By: Abramovici, Miron
.
Contributor(s): Breuer, Melvin A | Friedman, Arthur D.
Material type: 
BookSeries: Electrical engineering communications and signal processing series: Publisher: New York, NY : Computer Science Press, c1990Description: xxi, 653 p. : ill. ; 25 cm.ISBN: 0716781794 :.Subject(s): Digital integrated circuits -- Testing | Digital integrated circuits -- Design and construction
| Item type | Current location | Collection | Call number | Status | Notes | Date due | Item holds |
|---|---|---|---|---|---|---|---|
General Circulation Books
|
Non-fiction | TK7874 .A27 1990 (Browse shelf) | Available | M.O |
Total holds: 0
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| TK7871.8 .S77 2006 Solid state electronic devices / | TK7871.85.B45 2005 Electronic devices and circuits / | TK7871.85.S77 2000 Solid state electronic devices / | TK7874 .A27 1990 Digital systems testing and testable design / | TK7878.4.D54 1994 Principles of electronic instrumentation / | TK7881.S46 1998 modern power electronics: | TK7881 .S46 2011 Modern power electronics: |
Includes bibliographical references (p. 644-645) and index.
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