Abramovici, Miron.
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - New York, NY : Computer Science Press, c1990. - xxi, 653 p. : ill. ; 25 cm. - Electrical engineering, communications, and signal processing . - Electrical engineering communications and signal processing series. .
Includes bibliographical references (p. 644-645) and index.
0716781794 : $34.00
89025259
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
TK7874 / .A27 1990
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - New York, NY : Computer Science Press, c1990. - xxi, 653 p. : ill. ; 25 cm. - Electrical engineering, communications, and signal processing . - Electrical engineering communications and signal processing series. .
Includes bibliographical references (p. 644-645) and index.
0716781794 : $34.00
89025259
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
TK7874 / .A27 1990