000 03431nam a22005415i 4500
001 978-3-642-29761-8
003 DE-He213
005 20140220082847.0
007 cr nn 008mamaa
008 121025s2013 gw | s |||| 0|eng d
020 _a9783642297618
_9978-3-642-29761-8
024 7 _a10.1007/978-3-642-29761-8
_2doi
050 4 _aQC450-467
050 4 _aQC718.5.S6
072 7 _aPNFS
_2bicssc
072 7 _aPDND
_2bicssc
072 7 _aSCI078000
_2bisacsh
082 0 4 _a621.36
_223
100 1 _aFultz, Brent.
_eauthor.
245 1 0 _aTransmission Electron Microscopy and Diffractometry of Materials
_h[electronic resource] /
_cby Brent Fultz, James Howe.
250 _a4th ed. 2013.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg :
_bImprint: Springer,
_c2013.
300 _aXX, 761 p. 470 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aGraduate Texts in Physics,
_x1868-4513
505 0 _aDiffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems.
520 _aThis book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
650 0 _aPhysics.
650 0 _aSpectroscopy.
650 0 _aSurfaces (Physics).
650 1 4 _aPhysics.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aSpectroscopy/Spectrometry.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aSurface and Interface Science, Thin Films.
700 1 _aHowe, James.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642297601
830 0 _aGraduate Texts in Physics,
_x1868-4513
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-642-29761-8
912 _aZDB-2-PHA
999 _c96936
_d96936