000 | 03431nam a22005415i 4500 | ||
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001 | 978-3-642-29761-8 | ||
003 | DE-He213 | ||
005 | 20140220082847.0 | ||
007 | cr nn 008mamaa | ||
008 | 121025s2013 gw | s |||| 0|eng d | ||
020 |
_a9783642297618 _9978-3-642-29761-8 |
||
024 | 7 |
_a10.1007/978-3-642-29761-8 _2doi |
|
050 | 4 | _aQC450-467 | |
050 | 4 | _aQC718.5.S6 | |
072 | 7 |
_aPNFS _2bicssc |
|
072 | 7 |
_aPDND _2bicssc |
|
072 | 7 |
_aSCI078000 _2bisacsh |
|
082 | 0 | 4 |
_a621.36 _223 |
100 | 1 |
_aFultz, Brent. _eauthor. |
|
245 | 1 | 0 |
_aTransmission Electron Microscopy and Diffractometry of Materials _h[electronic resource] / _cby Brent Fultz, James Howe. |
250 | _a4th ed. 2013. | ||
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg : _bImprint: Springer, _c2013. |
|
300 |
_aXX, 761 p. 470 illus. _bonline resource. |
||
336 |
_atext _btxt _2rdacontent |
||
337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aGraduate Texts in Physics, _x1868-4513 |
|
505 | 0 | _aDiffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems. | |
520 | _aThis book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. | ||
650 | 0 | _aPhysics. | |
650 | 0 | _aSpectroscopy. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aPhysics. |
650 | 2 | 4 | _aSpectroscopy and Microscopy. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
650 | 2 | 4 | _aSpectroscopy/Spectrometry. |
650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
650 | 2 | 4 | _aSurface and Interface Science, Thin Films. |
700 | 1 |
_aHowe, James. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783642297601 |
830 | 0 |
_aGraduate Texts in Physics, _x1868-4513 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-642-29761-8 |
912 | _aZDB-2-PHA | ||
999 |
_c96936 _d96936 |