000 | 03088nam a22005415i 4500 | ||
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001 | 978-3-642-18018-7 | ||
003 | DE-He213 | ||
005 | 20140220082844.0 | ||
007 | cr nn 008mamaa | ||
008 | 120827s2013 gw | s |||| 0|eng d | ||
020 |
_a9783642180187 _9978-3-642-18018-7 |
||
024 | 7 |
_a10.1007/978-3-642-18018-7 _2doi |
|
050 | 4 | _aQC176-176.9 | |
072 | 7 |
_aPNFS _2bicssc |
|
072 | 7 |
_aSCI077000 _2bisacsh |
|
082 | 0 | 4 |
_a530.41 _223 |
100 | 1 |
_aPajot, Bernard. _eauthor. |
|
245 | 1 | 0 |
_aOptical Absorption of Impurities and Defects in Semiconducting Crystals _h[electronic resource] : _bElectronic Absorption of Deep Centres and Vibrational Spectra / _cby Bernard Pajot, Bernard Clerjaud. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg : _bImprint: Springer, _c2013. |
|
300 |
_aXXVII, 510 p. 159 illus., 7 illus. in color. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aSpringer Series in Solid-State Sciences, _x0171-1873 ; _v169 |
|
505 | 0 | _aForeword -- Preface -- Notations and symbols -- Introduction -- Bulk optical absorption -- Instrumental methods for absorption spectroscopy -- Absorption of deep centres and bound excitons -- Vibrational absorption of substitutional atoms and related centres -- Vibrational absorption of interstitial atoms and related centres -- Vibrational absorption III -- Quasi substitutional atoms and related centres -- Vibrational spectra related to hydrogen. | |
520 | _aThis book outlines, with the help of several specific examples, the important role played by absorption spectroscopy in the investigation of deep-level centers introduced in semiconductors and insulators like diamond, silicon, germanium and gallium arsenide by high-energy irradiation, residual impurities, and defects produced during crystal growth. It also describes the crucial role played by vibrational spectroscopy to determine the atomic structure and symmetry of complexes associated with light impurities like hydrogen, carbon, nitrogen and oxygen, and as a tool for quantitative analysis of these elements in the materials. | ||
650 | 0 | _aPhysics. | |
650 | 0 | _aMicrowaves. | |
650 | 0 | _aOptical materials. | |
650 | 0 | _aNanotechnology. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aPhysics. |
650 | 2 | 4 | _aSolid State Physics. |
650 | 2 | 4 | _aOptics, Optoelectronics, Plasmonics and Optical Devices. |
650 | 2 | 4 | _aOptical and Electronic Materials. |
650 | 2 | 4 | _aMicrowaves, RF and Optical Engineering. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
650 | 2 | 4 | _aNanotechnology. |
700 | 1 |
_aClerjaud, Bernard. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783642180170 |
830 | 0 |
_aSpringer Series in Solid-State Sciences, _x0171-1873 ; _v169 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-642-18018-7 |
912 | _aZDB-2-PHA | ||
999 |
_c96754 _d96754 |