000 04201nam a22005655i 4500
001 978-3-642-37530-9
003 DE-He213
005 20140220082517.0
007 cr nn 008mamaa
008 130907s2014 gw | s |||| 0|eng d
020 _a9783642375309
_9978-3-642-37530-9
024 7 _a10.1007/978-3-642-37530-9
_2doi
050 4 _aQC350-467
050 4 _aTA1501-1820
050 4 _aQC392-449.5
050 4 _aTA1750-1750.22
072 7 _aTTB
_2bicssc
072 7 _aPHJ
_2bicssc
072 7 _aTEC030000
_2bisacsh
082 0 4 _a621.36
_223
100 1 _aSuga, Shigemasa.
_eauthor.
245 1 0 _aPhotoelectron Spectroscopy
_h[electronic resource] :
_bBulk and Surface Electronic Structures /
_cby Shigemasa Suga, Akira Sekiyama.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg :
_bImprint: Springer,
_c2014.
300 _aXVIII, 378 p. 192 illus., 70 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Series in Optical Sciences,
_x0342-4111 ;
_v176
505 0 _aTheoretical Background -- Instrumentation and Methodology -- Bulk and Surface Sensitivity of Photoelectron Spectroscopy -- Examples of Angle Integrated Photoelectron Spectroscopy -- Angle-Resolved Photoelectron Spectroscopy in HV-regions -- High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems -- Very Low Photon Energy Photoelectron Spectroscopy -- Inverse Photoemission -- Photoelectron Diffraction -- Complementary Techniques for Studying Bulk Electronic Structures -- Surface Spectroscopy by Scanning Tunneling Microscope.
520 _aPhotoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy.
650 0 _aPhysics.
650 0 _aChemistry, Physical organic.
650 0 _aSurfaces (Physics).
650 1 4 _aPhysics.
650 2 4 _aOptics, Optoelectronics, Plasmonics and Optical Devices.
650 2 4 _aOptics and Electrodynamics.
650 2 4 _aSurface and Interface Science, Thin Films.
650 2 4 _aQuantum Optics.
650 2 4 _aPhysical Chemistry.
650 2 4 _aCharacterization and Evaluation of Materials.
700 1 _aSekiyama, Akira.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642375293
830 0 _aSpringer Series in Optical Sciences,
_x0342-4111 ;
_v176
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-642-37530-9
912 _aZDB-2-PHA
999 _c93203
_d93203