000 01299nam a22003975i 4500
001 978-90-481-2360-5
003 DE-He213
005 20130515022417.0
007 cr nn 008mamaa
008 100301s2009 ne | s |||| 0|eng d
020 _a9789048123605
_9978-90-481-2360-5
024 7 _a10.1007/978-90-481-2360-5
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aDrechsler, Rolf.
245 1 0 _aTest Pattern Generation using Boolean Proof Engines
_h[electronic resource] /
_cby Rolf Drechsler, Stephan Eggersglüβ, Görschwin Fey, Daniel Tille.
260 _aDordrecht :
_bSpringer Netherlands,
_c2009.
300 _bdigital.
650 0 _aEngineering.
650 0 _aElectronics.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _aEggersglüβ, Stephan.
700 1 _aFey, Görschwin.
700 1 _aTille, Daniel.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9789048123599
856 4 0 _uhttp://dx.doi.org/10.1007/978-90-481-2360-5
912 _aZDB-2-ENG
999 _c87223
_d87223