000			01737nam a22005175i 4500
001			978-3-642-15813-1
003			DE-He213
005			20130515022114.0
007			cr nn 008mamaa
008			110208s2011 gw | s |||| 0|eng d
020			_a9783642158131 _9978-3-642-15813-1
024	7		_a10.1007/978-3-642-15813-1 _2doi
050		4	_aQC350-467
050		4	_aTA1501-1820
050		4	_aQC392-449.5
072		7	_aTTB _2bicssc
072		7	_aTEC030000 _2bisacsh
082	0	4	_a621.36 _223
100	1		_aFerraro, Pietro.
245	1	0	_aCoherent Light Microscopy _h[electronic resource] : _bImaging and Quantitative Phase Analysis / _cedited by Pietro Ferraro, Adam Wax, Zeev Zalevsky.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011.
300			_bdigital.
490	0		_aSpringer Series in Surface Sciences, _x0931-5195 ; _v46
650		0	_aPhysics.
650		0	_aRadiology, Medical.
650		0	_aMicroscopy.
650		0	_aBiomaterials.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aPhysics.
650	2	4	_aOptics, Optoelectronics, Plasmonics and Optical Devices.
650	2	4	_aBiological Microscopy.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aBiomaterials.
650	2	4	_aNanotechnology.
650	2	4	_aImaging / Radiology.
700	1		_aWax, Adam.
700	1		_aZalevsky, Zeev.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783642158124
830		0	_aSpringer Series in Surface Sciences, _x0931-5195 ; _v46
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-642-15813-1
912			_aZDB-2-CMS
999			_c84099 _d84099