000			01640nam a22004695i 4500
001			978-3-642-02417-7
003			DE-He213
005			20130515021909.0
007			cr nn 008mamaa
008			100907s2010 gw | s |||| 0|eng d
020			_a9783642024177 _9978-3-642-02417-7
024	7		_a10.1007/978-3-642-02417-7 _2doi
050		4	_aQC350-467
050		4	_aTA1501-1820
050		4	_aQC392-449.5
072		7	_aTTB _2bicssc
072		7	_aTEC030000 _2bisacsh
082	0	4	_a621.36 _223
100	1		_aBreitenstein, Otwin.
245	1	0	_aLock-in Thermography _h[electronic resource] : _bBasics and Use for Evaluating Electronic Devices and Materials / _cby Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2010.
300			_bdigital.
490	0		_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10
650		0	_aPhysics.
650		0	_aEngineering.
650		0	_aMaterials.
650		0	_aSurfaces (Physics).
650	1	4	_aPhysics.
650	2	4	_aOptics, Optoelectronics, Plasmonics and Optical Devices.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aEngineering, general.
650	2	4	_aStructural Materials.
700	1		_aWarta, Wilhelm.
700	1		_aLangenkamp, Martin.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783642024160
830		0	_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v10
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-642-02417-7
912			_aZDB-2-ENG
999			_c81934 _d81934