000 01376nam a22003855i 4500
001 978-3-540-27412-4
003 DE-He213
005 20130515021250.0
007 cr nn 008mamaa
008 100301s2005 gw | s |||| 0|eng d
020 _a9783540274124
_9978-3-540-27412-4
024 7 _a10.1007/b139047
_2doi
100 1 _aLi, Flora M.
245 1 0 _aCCD Image Sensors in Deep-Ultraviolet
_h[electronic resource] :
_bDegradation Behavior and Damage Mechanisms /
_cby Flora M. Li, Arokia Nathan.
260 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2005.
300 _bdigital.
490 0 _aMicrotechnology and Mems,
_x1615-8326
650 0 _aChemistry.
650 0 _aSpectrum analysis.
650 0 _aElectronics.
650 0 _aOptical materials.
650 1 4 _aChemistry.
650 2 4 _aOptical and Electronic Materials.
650 2 4 _aOptical Spectroscopy, Ultrafast Optics.
650 2 4 _aPhysics and Applied Physics in Engineering.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _aNathan, Arokia.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783540226802
830 0 _aMicrotechnology and Mems,
_x1615-8326
856 4 0 _uhttp://dx.doi.org/10.1007/b139047
912 _aZDB-2-CMS
999 _c75597
_d75597