000 01296nam a22003855i 4500
001 978-1-4419-9946-7
003 DE-He213
005 20130515021109.0
007 cr nn 008mamaa
008 110714s2011 xxu| s |||| 0|eng d
020 _a9781441999467
_9978-1-4419-9946-7
024 7 _a10.1007/978-1-4419-9946-7
_2doi
050 4 _aTJ210.2-211.495
050 4 _aTJ163.12
072 7 _aTJFM
_2bicssc
072 7 _aTEC004000
_2bisacsh
082 0 4 _a629.8
_223
100 1 _aClévy, Cédric.
245 1 0 _aSignal Measurement and Estimation Techniques for Micro and Nanotechnology
_h[electronic resource] /
_cedited by Cédric Clévy, Micky Rakotondrabe, Nicolas Chaillet.
260 _aNew York, NY :
_bSpringer New York,
_c2011.
300 _bdigital.
650 0 _aEngineering.
650 1 4 _aEngineering.
650 2 4 _aControl, Robotics, Mechatronics.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aSignal, Image and Speech Processing.
700 1 _aRakotondrabe, Micky.
700 1 _aChaillet, Nicolas.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441999450
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-9946-7
912 _aZDB-2-ENG
999 _c73713
_d73713