000 01166nam a22003375i 4500
001 978-1-4419-7167-8
003 DE-He213
005 20130515021047.0
007 cr nn 008mamaa
008 101212s2011 xxu| s |||| 0|eng d
020 _a9781441971678
_9978-1-4419-7167-8
024 7 _a10.1007/978-1-4419-7167-8
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aKalinin, Sergei V.
245 1 0 _aScanning Probe Microscopy of Functional Materials
_h[electronic resource] :
_bNanoscale Imaging and Spectroscopy /
_cedited by Sergei V. Kalinin, Alexei Gruverman.
260 _aNew York, NY :
_bSpringer New York,
_c2011.
300 _bdigital.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
700 1 _aGruverman, Alexei.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441965677
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-7167-8
912 _aZDB-2-CMS
999 _c73287
_d73287