000 | 01128nam a22003495i 4500 | ||
---|---|---|---|
001 | 978-1-4419-6533-2 | ||
003 | DE-He213 | ||
005 | 20130515021040.0 | ||
007 | cr nn 008mamaa | ||
008 | 100812s2010 xxu| s |||| 0|eng d | ||
020 |
_a9781441965332 _9978-1-4419-6533-2 |
||
024 | 7 |
_a10.1007/978-1-4419-6533-2 _2doi |
|
050 | 4 | _aTA404.6 | |
072 | 7 |
_aTGMT _2bicssc |
|
072 | 7 |
_aTEC021000 _2bisacsh |
|
082 | 0 | 4 |
_a620.11 _223 |
100 | 1 | _aKirkland, Earl J. | |
245 | 1 | 0 |
_aAdvanced Computing in Electron Microscopy _h[electronic resource] / _cby Earl J. Kirkland. |
260 |
_aBoston, MA : _bSpringer US, _c2010. |
||
300 | _bdigital. | ||
650 | 0 | _aComputer engineering. | |
650 | 0 | _aSurfaces (Physics). | |
650 | 1 | 4 | _aMaterials Science. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
650 | 2 | 4 | _aElectrical Engineering. |
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9781441965325 |
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-1-4419-6533-2 |
912 | _aZDB-2-CMS | ||
999 |
_c73160 _d73160 |