000 01128nam a22003495i 4500
001 978-1-4419-6533-2
003 DE-He213
005 20130515021040.0
007 cr nn 008mamaa
008 100812s2010 xxu| s |||| 0|eng d
020 _a9781441965332
_9978-1-4419-6533-2
024 7 _a10.1007/978-1-4419-6533-2
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aKirkland, Earl J.
245 1 0 _aAdvanced Computing in Electron Microscopy
_h[electronic resource] /
_cby Earl J. Kirkland.
260 _aBoston, MA :
_bSpringer US,
_c2010.
300 _bdigital.
650 0 _aComputer engineering.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aElectrical Engineering.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441965325
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-6533-2
912 _aZDB-2-CMS
999 _c73160
_d73160