000 01293nam a22004095i 4500
001 978-1-4419-6348-2
003 DE-He213
005 20130515021038.0
007 cr nn 008mamaa
008 100805s2010 xxu| s |||| 0|eng d
020 _a9781441963482
_9978-1-4419-6348-2
024 7 _a10.1007/978-1-4419-6348-2
_2doi
050 4 _aTA169.7
050 4 _aT55-T55.3
050 4 _aTA403.6
072 7 _aTGPR
_2bicssc
072 7 _aTEC032000
_2bisacsh
082 0 4 _a658.56
_223
100 1 _aMcPherson, J.W.
245 1 0 _aReliability Physics and Engineering
_h[electronic resource] :
_bTime-To-Failure Modeling /
_cby J.W. McPherson.
260 _aBoston, MA :
_bSpringer US,
_c2010.
300 _bdigital.
650 0 _aEngineering.
650 0 _aMechanical engineering.
650 0 _aSystem safety.
650 0 _aElectronics.
650 1 4 _aEngineering.
650 2 4 _aQuality Control, Reliability, Safety and Risk.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aMechanical Engineering.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441963475
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-6348-2
912 _aZDB-2-ENG
999 _c73116
_d73116