000			01397nam a22004335i 4500
001			978-1-4419-0552-9
003			DE-He213
005			20130515021015.0
007			cr nn 008mamaa
008			100301s2010 xxu| s |||| 0|eng d
020			_a9781441905529 _9978-1-4419-0552-9
024	7		_a10.1007/978-1-4419-0552-9 _2doi
050		4	_aTK7800-8360
050		4	_aTK7874-7874.9
072		7	_aTJF _2bicssc
072		7	_aTEC008000 _2bisacsh
082	0	4	_a621.381 _223
100	1		_aSun, Yongke.
245	1	0	_aStrain Effect in Semiconductors _h[electronic resource] : _bTheory and Device Applications / _cby Yongke Sun, Scott E. Thompson, Toshikazu Nishida.
250			_aFirst.
260			_aBoston, MA : _bSpringer US, _c2010.
300			_bdigital.
650		0	_aEngineering.
650		0	_aElectronics.
650		0	_aOptical materials.
650	1	4	_aEngineering.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aSolid State Physics.
650	2	4	_aSpectroscopy and Microscopy.
650	2	4	_aOptical and Electronic Materials.
700	1		_aThompson, Scott E.
700	1		_aNishida, Toshikazu.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781441905512
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4419-0552-9
912			_aZDB-2-ENG
999			_c72660 _d72660