000 01499nam a22004335i 4500
001 978-1-4020-8615-1
003 DE-He213
005 20130515020858.0
007 cr nn 008mamaa
008 100301s2008 ne | s |||| 0|eng d
020 _a9781402086151
_9978-1-4020-8615-1
024 7 _a10.1007/978-1-4020-8615-1
_2doi
050 4 _aTA401-492
072 7 _aTGM
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aCullis, A. G.
245 1 0 _aMicroscopy of Semiconducting Materials 2007
_h[electronic resource] /
_cedited by A. G. Cullis, P. A. Midgley.
260 _aDordrecht :
_bSpringer Netherlands,
_c2008.
300 _bdigital.
490 0 _aSpringer Proceedings in Physics,
_x0930-8989 ;
_v120
650 0 _aMaterials.
650 0 _aWeights and measures.
650 0 _aParticles (Nuclear physics).
650 0 _aElectronics.
650 1 4 _aMaterial Science.
650 2 4 _aMaterials Science, general.
650 2 4 _aSolid State Physics and Spectroscopy.
650 2 4 _aMeasurement Science, Instrumentation.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _aMidgley, P. A.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781402086144
830 0 _aSpringer Proceedings in Physics,
_x0930-8989 ;
_v120
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4020-8615-1
912 _aZDB-2-CMS
999 _c71113
_d71113