| 000 | 01633nam a22004695i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4020-3920-1 | ||
| 003 | DE-He213 | ||
| 005 | 20130515020736.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2006 ne | s |||| 0|eng d | ||
| 020 |
_a9781402039201 _9978-1-4020-3920-1 |
||
| 024 | 7 |
_a10.1007/1-4020-3920-4 _2doi |
|
| 050 | 4 | _aQD901-999 | |
| 072 | 7 |
_aPHFC _2bicssc |
|
| 072 | 7 |
_aSCI016000 _2bisacsh |
|
| 082 | 0 | 4 |
_a548 _223 |
| 100 | 1 | _aWeirich, Thomas E. | |
| 245 | 1 | 0 |
_aElectron Crystallography _h[electronic resource] : _bNovel Approaches for Structure Determination of Nanosized Materials / _cedited by Thomas E. Weirich, János L. Lábár, Xiaodong Zou. |
| 260 |
_aDordrecht : _bSpringer Netherlands, _c2006. |
||
| 300 | _bdigital. | ||
| 490 | 0 |
_aNATO Science Series II: Mathematics, Physics and Chemistry, _x1568-2609 ; _v211 |
|
| 650 | 0 | _aPhysics. | |
| 650 | 0 | _aCatalysis. | |
| 650 | 0 | _aMineralogy. | |
| 650 | 0 | _aCrystallography. | |
| 650 | 0 | _aSurfaces (Physics). | |
| 650 | 1 | 4 | _aPhysics. |
| 650 | 2 | 4 | _aCrystallography. |
| 650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
| 650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
| 650 | 2 | 4 | _aMineralogy. |
| 650 | 2 | 4 | _aCatalysis. |
| 700 | 1 | _aLábár, János L. | |
| 700 | 1 | _aZou, Xiaodong. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781402039188 |
| 830 | 0 |
_aNATO Science Series II: Mathematics, Physics and Chemistry, _x1568-2609 ; _v211 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/1-4020-3920-4 |
| 912 | _aZDB-2-PHA | ||
| 999 |
_c69640 _d69640 |
||