000			01540nam a22004575i 4500
001			978-0-387-74747-7
003			DE-He213
005			20130515020556.0
007			cr nn 008mamaa
008			100301s2008 xxu| s |||| 0|eng d
020			_a9780387747477 _9978-0-387-74747-7
024	7		_a10.1007/978-0-387-74747-7 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aTehranipoor, Mohammad.
245	1	0	_aEmerging Nanotechnologies _h[electronic resource] : _bTest, Defect Tolerance, and Reliability / _cedited by Mohammad Tehranipoor.
260			_aBoston, MA : _bSpringer US, _c2008.
300			_bdigital.
490	0		_aFrontiers in Electronic Testing, _x0929-1296 ; _v37
650		0	_aEngineering.
650		0	_aSystem safety.
650		0	_aComputer engineering.
650		0	_aElectronics.
650		0	_aSystems engineering.
650		0	_aNanotechnology.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNanotechnology.
650	2	4	_aQuality Control, Reliability, Safety and Risk.
650	2	4	_aElectrical Engineering.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387747460
830		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v37
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-74747-7
912			_aZDB-2-ENG
999			_c67926 _d67926