000 01543nam a22004455i 4500
001 978-0-387-34609-0
003 DE-He213
005 20130515020452.0
007 cr nn 008mamaa
008 100301s2006 xxu| s |||| 0|eng d
020 _a9780387346090
_9978-0-387-34609-0
024 7 _a10.1007/0-387-34609-0
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aSilva, Francisco.
245 1 4 _aThe Core Test Wrapper Handbook
_h[electronic resource] :
_bRationale and Application of IEEE Std. 1500™ /
_cby Francisco Silva, Teresa McLaurin, Tom Waayers.
260 _aBoston, MA :
_bSpringer US,
_c2006.
300 _bdigital.
490 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v35
650 0 _aEngineering.
650 0 _aComputer aided design.
650 0 _aElectronics.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aComputer-Aided Engineering (CAD, CAE) and Design.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aElectronic and Computer Engineering.
700 1 _aMcLaurin, Teresa.
700 1 _aWaayers, Tom.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387307510
830 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v35
856 4 0 _uhttp://dx.doi.org/10.1007/0-387-34609-0
912 _aZDB-2-ENG
999 _c66826
_d66826