000 | 00974nam a2200277 a 4500 | ||
---|---|---|---|
001 | 4316135 | ||
005 | 20130812144812.0 | ||
008 | 870429s1987 nyua b 001 0 eng | ||
010 | _a 87081303 | ||
020 | _a0070095221 | ||
040 |
_aDLC _cDLC _dkepu |
||
050 | 0 | 0 |
_aTK7878.4 _b.B48 1987 |
082 | 0 | 0 | _219 |
100 | 1 |
_aByers, T. J. _910788 |
|
245 | 1 | 0 |
_aElectronic test equipment : _btheory and applications / _cT.J. Byers. |
260 |
_aNew York, N.Y. : _bIntertext Publications : _bMcGraw-Hill Book Co., _cc1987. |
||
300 |
_axii, 335 p. : _bill. ; _c24 cm. |
||
500 | _aCover title: Electronic test equipment : principles and applications. | ||
500 | _aIncludes index. | ||
504 | _aBibliography: p. 315-317. | ||
650 | 0 |
_aElectronic instruments. _93143 |
|
650 | 0 |
_aElectronic measurements. _93142 |
|
906 |
_a7 _bcbc _corignew _d3 _eopcn _f19 _gy-gencatlg |
||
942 |
_2lcc _cBK _hTK7878.4 _k.B48 1987 |
||
999 |
_c22741 _d22741 |