000 00974nam a2200277 a 4500
001 4316135
005 20130812144812.0
008 870429s1987 nyua b 001 0 eng
010 _a 87081303
020 _a0070095221
040 _aDLC
_cDLC
_dkepu
050 0 0 _aTK7878.4
_b.B48 1987
082 0 0 _219
100 1 _aByers, T. J.
_910788
245 1 0 _aElectronic test equipment :
_btheory and applications /
_cT.J. Byers.
260 _aNew York, N.Y. :
_bIntertext Publications :
_bMcGraw-Hill Book Co.,
_cc1987.
300 _axii, 335 p. :
_bill. ;
_c24 cm.
500 _aCover title: Electronic test equipment : principles and applications.
500 _aIncludes index.
504 _aBibliography: p. 315-317.
650 0 _aElectronic instruments.
_93143
650 0 _aElectronic measurements.
_93142
906 _a7
_bcbc
_corignew
_d3
_eopcn
_f19
_gy-gencatlg
942 _2lcc
_cBK
_hTK7878.4
_k.B48 1987
999 _c22741
_d22741