000 01392cam a2200301 a 4500
999 _c124953
_d124953
001 12825874
003 KEPU
005 20220124131421.0
008 020620s2003 nyu b 001 0 eng
010 _a 2002026733
020 _a0471149772 (cloth : alk. paper)
040 _aDLC
_cTUK
_dDLC
043 _an-us---
050 0 0 _aLB3051
_b.K83 2003
082 0 0 _a371.26/0973
_221
100 1 _aKubiszyn, Tom.
_93741
245 1 0 _aEducational testing and measurement :
_bclassroom application and practice /
_cTom Kubiszyn, Gary Borich.
250 _a7th ed.
260 _aNew York :
_bJ. Wiley & Sons, Inc.,
_cc2003.
300 _axv, 508 p. ;
_c25 cm.
504 _aIncludes bibliographical references (p. 484-494) and index.
650 0 _aEducational tests and measurements
_zUnited States.
_949238
700 1 _aBorich, Gary D.
_93743
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley036/2002026733.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/wiley023/2002026733.html
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/enhancements/fy0613/2002026733-b.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2lcc
_cBK