| 000 | 02511nam a22004215i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4419-6533-2 | ||
| 003 | DE-He213 | ||
| 005 | 20140220084510.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100812s2010 xxu| s |||| 0|eng d | ||
| 020 |
_a9781441965332 _9978-1-4419-6533-2 |
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| 024 | 7 |
_a10.1007/978-1-4419-6533-2 _2doi |
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| 050 | 4 | _aTA404.6 | |
| 072 | 7 |
_aTGMT _2bicssc |
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| 072 | 7 |
_aTEC021000 _2bisacsh |
|
| 082 | 0 | 4 |
_a620.11 _223 |
| 100 | 1 |
_aKirkland, Earl J. _eauthor. |
|
| 245 | 1 | 0 |
_aAdvanced Computing in Electron Microscopy _h[electronic resource] / _cby Earl J. Kirkland. |
| 264 | 1 |
_aBoston, MA : _bSpringer US, _c2010. |
|
| 300 |
_aX, 289p. 250 illus., 125 illus. in color. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 505 | 0 | _aThe Transmission Electron Microscope -- Linear Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programs -- Plotting Transfer Functions -- The Fourier Projection Theorem -- Atomic Potentials and Scattering Factors -- Bilinear Interpolation -- 3D Perspective View. | |
| 520 | _aAdvanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity | ||
| 650 | 0 | _aComputer engineering. | |
| 650 | 0 | _aSurfaces (Physics). | |
| 650 | 1 | 4 | _aMaterials Science. |
| 650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
| 650 | 2 | 4 | _aElectrical Engineering. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781441965325 |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-1-4419-6533-2 |
| 912 | _aZDB-2-PHA | ||
| 999 |
_c110652 _d110652 |
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