000			03531nam a22004455i 4500
001			978-1-4419-0931-2
003			DE-He213
005			20140220084503.0
007			cr nn 008mamaa
008			100301s2010 xxu| s |||| 0|eng d
020			_a9781441909312 _9978-1-4419-0931-2
024	7		_a10.1007/978-1-4419-0931-2 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aGarg, Rajesh. _eauthor.
245	1	0	_aAnalysis and Design of Resilient VLSI Circuits _h[electronic resource] : _bMitigating Soft Errors and Process Variations / _cby Rajesh Garg, Sunil P. Khatri.
264		1	_aBoston, MA : _bSpringer US, _c2010.
300			_bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aSoft Errors -- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits -- Analytical Determination of the Radiation-induced Pulse Shape -- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes -- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits -- Clamping Diode-based Radiation Tolerant Circuit Design Approach -- Split-output-based Radiation Tolerant Circuit Design Approach -- Process Variations -- Sensitizable Statistical Timing Analysis -- A Variation Tolerant Combinational Circuit Design Approach Using Parallel Gates -- Process Variation Tolerant Single-supply True Voltage Level Shifter -- Conclusions and Future Directions.
520			_aThis book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors. This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.
650		0	_aEngineering.
650		0	_aComputer aided design.
650		0	_aSystems engineering.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aComputer-Aided Engineering (CAD, CAE) and Design.
700	1		_aKhatri, Sunil P. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781441909305
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4419-0931-2
912			_aZDB-2-ENG
999			_c110277 _d110277