000 03781nam a22005055i 4500
001 978-1-4419-6993-4
003 DE-He213
005 20140220083722.0
007 cr nn 008mamaa
008 100927s2011 xxu| s |||| 0|eng d
020 _a9781441969934
_9978-1-4419-6993-4
024 7 _a10.1007/978-1-4419-6993-4
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aNicolaidis, Michael.
_eeditor.
245 1 0 _aSoft Errors in Modern Electronic Systems
_h[electronic resource] /
_cedited by Michael Nicolaidis.
264 1 _aBoston, MA :
_bSpringer US :
_bImprint: Springer,
_c2011.
300 _aXVIII, 318 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v41
505 0 _aSoft Errors from Space to Ground: Historical Overview, Empirical Evidence, and Future Trends -- Radiation Induced Single-Event Effects: Physical Mechanisms and Classification -- JEDEC Standard on Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors -- Cell-Level Modelling and Simulation -- Circuit and System Level Modelling and Simulation -- Hardware Fault Injection -- Accelerated Radiation Testing for Space Applications -- Testing for Ground-Level Applications -- Soft Error Mitigation Techniques -- Convergence of Mitigation Techniques for Soft Errors and Other Reliability Issues and Power Aware Mitigation Techniques -- Software Level Soft-Error Mitigation Techniques -- System Level Soft-Error Mitigation Techniques.
520 _aSoft Errors in Modern Electronic Systems describes the state-of-the-art developments and open issues in the field of soft errors. This work not only highlights a comprehensive presentation of soft errors related issues and challenges but also presents the most efficient solutions, methodologies and tools. The eleven chapters written by highly qualified experts provide a comprehensive description of the complex chain of the physical processes leading to the occurrence of soft errors, as well as of the numerous techniques and tools enabling the SER qualification of electronic systems during the design phase and after production, including: nuclear reactions of cosmic rays with the atmosphere (neutron and proton generation at ground level); nuclear reactions of atmospheric neutrons and protons with die atoms (secondary particles generation); coulomb interaction (ionization); device physics (charge collection); electrical simulation; event driven simulation; logic domain simulation; RTL simulation; hardware emulation, and radiation testing. The book also provides a comprehensive description of various hardware and software techniques enabling soft-error mitigation at moderate cost. Soft Errors in Modern Electronic Systems is a useful book for circuit and system designers, researchers, students and professors.
650 0 _aEngineering.
650 0 _aOperating systems (Computers).
650 0 _aComputer system performance.
650 0 _aComputer engineering.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aSystem Performance and Evaluation.
650 2 4 _aPerformance and Reliability.
650 2 4 _aElectrical Engineering.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441969927
830 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v41
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-6993-4
912 _aZDB-2-ENG
999 _c105671
_d105671