Library Services | Technical University of Kenya catalog › Results of search for 'su:{defects.}'

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	1.	Common building defects:diagnosis and remedy: / national building agency by "0, . ". Edition: 1 ed.Material type: Book; Format: print ; Literary form: Not fiction Publisher: uk : construction press c1979Availability: Items available for loan: [Call number: TH441.N38 1979] (1). Place hold Add to cart (remove)
	2.	Semiconductor technology : processing and novel fabrication techniques / edited by Mikhail Levinshtein, Michael S. Shur. by Levinshteĭn, M. E. (Mikhail Efimovich) \| Shur, Michael. Material type: Book; Format: print ; Literary form: Not fiction Publisher: New York : Wiley, c1997Online access: Contributor biographical information \| Publisher description \| Table of contents Availability: Items available for loan: [Call number: TK7871.85] (1). Place hold Add to cart (remove)
	3.	No cover image available Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989 / edited by K. Sumino. by International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) \| Sumino, K. (Kojī), 1931-. Material type: Book; Format: print ; Literary form: Not fiction Publisher: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990Availability: Items available for loan: [Call number: QC611.6.D4 1989] (1). Place hold Add to cart (remove)
	4.	Technical Due Diligence and Building Surveying for Commercial Property / by Adrian Tagg. by Tagg, Adrian [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : Routledge, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available Add to cart (remove)

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