Library Services | Technical University of Kenya catalog › Results of search for 'au:"Schmidt, David."'

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	1.	Verification, Model Checking, and Abstract Interpretation [electronic resource] : 12th International Conference, VMCAI 2011, Austin, TX, USA, January 23-25, 2011. Proceedings / edited by Ranjit Jhala, David Schmidt. by Jhala, Ranjit \| Schmidt, David \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Static Analysis [electronic resource] : 19th International Symposium, SAS 2012, Deauville, France, September 11-13, 2012. Proceedings / edited by Antoine Miné, David Schmidt. by Miné, Antoine [editor.] \| Schmidt, David [editor.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012Online access: Click here to access online Availability: No items available Add to cart (remove)
	3.	Verification, Model Checking, and Abstract Interpretation [electronic resource] : 12th International Conference, VMCAI 2011, Austin, TX, USA, January 23-25, 2011. Proceedings / edited by Ranjit Jhala, David Schmidt. by Jhala, Ranjit [editor.] \| Schmidt, David [editor.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)

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