Your search returned 2 results. Subscribe to this search

|
1. Pattern Recognition and Image Analysis [electronic resource] : Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part I / edited by Jorge S. Marques, Nicolás Pérez de la Blanca, Pedro Pina.

by Marques, Jorge S | Pérez de la Blanca, Nicolás | Pina, Pedro | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Online access: Click here to access online Availability: No items available
2. Pattern Recognition and Image Analysis [electronic resource] : Second Iberian Conference, IbPRIA 2005, Estoril, Portugal, June 7-9, 2005, Proceedings, Part II / edited by Jorge S. Marques, Nicolás Pérez de la Blanca, Pedro Pina.

by Marques, Jorge S | Pérez de la Blanca, Nicolás | Pina, Pedro | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Online access: Click here to access online Availability: No items available

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue