Library Services | Technical University of Kenya catalog › Results of search for 'au:"Kwok, James T."'

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	1.	Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder. by Yeung, Dit-Yan \| Kwok, James T \| Fred, Ana \| Roli, Fabio \| Ridder, Dick \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings / edited by Niels Vitoria Lobo, Takis Kasparis, Fabio Roli, James T. Kwok, Michael Georgiopoulos, Georgios C. Anagnostopoulos, Marco Loog. by Vitoria Lobo, Niels \| Kasparis, Takis \| Roli, Fabio \| Kwok, James T \| Georgiopoulos, Michael \| Anagnostopoulos, Georgios C \| Loog, Marco \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008Online access: Click here to access online Availability: No items available Add to cart (remove)

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