Library Services | Technical University of Kenya catalog › Results of search for 'au:"Kim, Sang-Woon."'

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	1.	Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications [electronic resource] : 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings / edited by César San Martin, Sang-Woon Kim. by San Martin, César \| Kim, Sang-Woon \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications [electronic resource] : 16th Iberoamerican Congress, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings / edited by César San Martin, Sang-Woon Kim. by San Martin, César [editor.] \| Kim, Sang-Woon [editor.] \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011Online access: Click here to access online Availability: No items available Add to cart (remove)

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