Library Services | Technical University of Kenya catalog › Results of search for 'au:"Bin, Eyal."'

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	1.	Hardware and Software, Verification and Testing [electronic resource] : First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers / edited by Shmuel Ur, Eyal Bin, Yaron Wolfsthal. by Ur, Shmuel \| Bin, Eyal \| Wolfsthal, Yaron \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006Online access: Click here to access online Availability: No items available Add to cart (remove)
	2.	Hardware and Software, Verification and Testing [electronic resource] : Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected Papers / edited by Eyal Bin, Avi Ziv, Shmuel Ur. by Bin, Eyal \| Ziv, Avi \| Ur, Shmuel \| SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007Online access: Click here to access online Availability: No items available Add to cart (remove)

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