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61. Structures Under Crash and Impact [electronic resource] : Continuum Mechanics, Discretization and Experimental Characterization / by Stefan Josef Hiermaier.

by Hiermaier, Stefan Josef | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2008Online access: Click here to access online Availability: No items available
62. One-Dimensional Nanostructures [electronic resource] / edited by Zhiming M. Wang.

by Wang, Zhiming M | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York, 2008Online access: Click here to access online Availability: No items available
63. Flexible Electronics [electronic resource] : Materials and Applications / edited by Alberto Salleo, William S. Wong.

by Salleo, Alberto | Wong, William S | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
64. Physics and Properties of Narrow Gap Semiconductors [electronic resource] / by Junhao Chu, Arden Sher.

by Chu, Junhao | Sher, Arden | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York, 2008Online access: Click here to access online Availability: No items available
65. Evolution of Thin Film Morphology [electronic resource] : Modeling and Simulations / by Matthew Pelliccione, Toh-Ming Lu.

by Pelliccione, Matthew | Lu, Toh-Ming | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York, 2008Online access: Click here to access online Availability: No items available
66. Atomistic Modeling of Materials Failure [electronic resource] / edited by Markus J. Buehler.

by Buehler, Markus J | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2008Online access: Click here to access online Availability: No items available
67. Transmission Electron Microscopy [electronic resource] : A Textbook for Materials Science / by David B. Williams, C. Barry Carter.

by Williams, David B | Carter, C. Barry | SpringerLink (Online service).

Edition: 2.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
68. Wafer Level 3-D ICs Process Technology [electronic resource] / edited by Chuan Seng Tan, Ronald J. Gutmann, L. Rafael Reif.

by Tan, Chuan Seng | Gutmann, Ronald J | Reif, L. Rafael | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2008Online access: Click here to access online Availability: No items available
69. Nanomaterials for Solid State Hydrogen Storage [electronic resource] / by Robert A. Varin, Tomasz Czujko, Zbigniew S. Wronski.

by Varin, Robert A | Czujko, Tomasz | Wronski, Zbigniew S | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
70. Toward Functional Nanomaterials [electronic resource] / edited by Zhiming M. Wang.

by Wang, Zhiming M | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer US, 2009Online access: Click here to access online Availability: No items available
71. Photoemission from Optoelectronic Materials and their Nanostructures [electronic resource] / by Kamakhya Prasad Ghatak, Sitangshu Bhattacharya, Debashis De.

by Ghatak, Kamakhya Prasad | Bhattacharya, Sitangshu | De, Debashis | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer US, 2009Online access: Click here to access online Availability: No items available
72. Safety of Nanoparticles [electronic resource] : From Manufacturing to Medical Applications / edited by Thomas J. Webster.

by Webster, Thomas J | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York, 2009Online access: Click here to access online Availability: No items available
73. Neutron Imaging and Applications [electronic resource] : A Reference for the Imaging Community / edited by Hassina Z. Bilheux, Robert McGreevy, Ian S. Anderson.

by Bilheux, Hassina Z | McGreevy, Robert | Anderson, Ian S | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
74. Micro and Nano Mechanical Testing of Materials and Devices [electronic resource] / edited by James C.M. Li, Fuqian Yang.

by Li, James C.M | Yang, Fuqian | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2008Online access: Click here to access online Availability: No items available
75. Image Correlation for Shape, Motion and Deformation Measurements [electronic resource] : Basic Concepts,Theory and Applications / by Hubert Schreier, Jean-José Orteu, Michael A. Sutton.

by Schreier, Hubert | Orteu, Jean-José | Sutton, Michael A | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
76. Cathodic Arcs [electronic resource] : From Fractal Spots to Energetic Condensation / by André Anders.

by Anders, André | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer US, 2009Online access: Click here to access online Availability: No items available
77. Sapphire [electronic resource] : Material, Manufacturing, Applications / by Valerian Pishchik, Leonid A. Lytvynov, Elena R. Dobrovinskaya.

by Pishchik, Valerian | Lytvynov, Leonid A | Dobrovinskaya, Elena R | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
78. Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis [electronic resource] / by Patrick Echlin.

by Echlin, Patrick | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
79. Machining with Nanomaterials [electronic resource] / edited by Jonathan Morrell, Mark J. Jackson.

by Morrell, Jonathan | Jackson, Mark J | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available
80. Electron Backscatter Diffraction in Materials Science [electronic resource] / edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field.

by Schwartz, Adam J | Kumar, Mukul | Adams, Brent L | Field, David P | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2009Online access: Click here to access online Availability: No items available

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